Memory Characteristics of Al2O3/La2O3/SiO2Multi-Layer Structures for Charge Trap Flash Devices
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چکیده
منابع مشابه
Charge Spreading Effect of Stored Charge on Retention Characteristics in SONOS NAND Flash Memory Devices
Copyright ©2015 KIEEME. All rights reserved. This is an open-access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/by-nc/3.0) which permits unrestricted noncommercial use, distribution, and reproduction in any medium, provided the original work is properly cited. pISSN: 1229-7607 eISSN: 2092-7592 DOI: http://dx...
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ژورنال
عنوان ژورنال: Korean Journal of Materials Research
سال: 2009
ISSN: 1225-0562
DOI: 10.3740/mrsk.2009.19.9.462